Sunil (Sonny) Banwari is Vice President of Advantest Cloud Solutions (ACS), a strategic business unit within Advantest Corporation directed at helping customers accomplish intelligent data-driven workflows. Sonny boasts 30 years of U.S. and international experience in electronics and semiconductor multi-site manufacturing. He is recognized for delivering top results in positions of increasing responsibility at the executive level at companies including Intel Corp (20 yrs) and ON Semiconductor (7yrs). He maintains a high profile within the Asia technology sector and has served on industry association boards in the Philippines, India, Taiwan and China. Sonny hold a BS in Physics and an MSEE from Arizona State and a certificate from MIT Sloan on “Artificial Intelligence and Business Strategy.” An Industry 4.0 consultant, Sonny is now leading the business development for Advantest’s cloud solutions business. He is multi-lingual (English, Japanese, Spanish, Hindi) and has held expat assignments in Japan, India, Costa Rica and Philippines.
Hyper-Edge Computing and AI/ML Analytics for Chiplet Yield and Quality
Semiconductor test, like many industries, is experiencing a data revolution. With unprecedented demand for electronics of ever higher complexity, and in the face of a bend in the curve of Moore’s Law, manufacturers are moving to a chiplet-based paradigm. These products enable us to cram incomprehensible numbers of components into a growing array of products, resulting in the world’s total output of a staggering 1.6×1021 transistors in 2021 according to VLSI Research. All those components must be tested, and the corresponding amount of test data would meet any reasonable definition of “Big Data”. Compounding the problem, the sources of data feeding the test process are becoming more diversified, and traditional production electrical data is being augmented with equipment metadata, optical inspection data, on-chip lifecycle management data, and others, limited only by our collective creativity.
In this presentation, we describe data analytics-related trends that we observe in the industry. We elaborate the challenges that we see such as high-performance real-time decision-making in test operations and IP and data security across a disaggregated supply chain. We will give some specific examples of collaborative solutions being developed by Advantest and a wide ecosystem of analytics partners to address these issues including adaptive test solutions from fab parametric (e-test) to system level test and show how they solve real industry problems and result in significant improvements in product decision-making, quality, yield and capacity (the last two critical in the time of industry-wide shortages). We also describe the launch of an open solution ecosystem ACS Solution Store to enable access to a wide range of innovation from a galaxy of ecosystem partners specializing in SLM and analytics. Finally, we conclude with observations about what we see as crucial next steps.
Advantest (TSE: 6857) is the leading manufacturer of automatic test and measurement equipment used in the design and production of semiconductors for applications including 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also conducts R&D to address emerging testing challenges and applications, produces multi-vision metrology scanning electron microscopes essential to photomask manufacturing, and offers groundbreaking 3D imaging and analysis tools. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. More information is available at www.advantest.com.
Company Product and Service Information:
Advantest’s core product line, semiconductor test equipment, is used by IC manufacturers to test their semiconductors with high accuracy and efficiency, ensuring that they operate properly and meet performance and reliability requirements. The company uniquely provides one-stop shopping for the test cell, which includes test systems, test handlers, and device interfaces which are essential to semiconductor package test. In addition, Advantest Test Solutions offers a series of SLT and Burn-In solutions that can span from high mix/low volume applications to those that have the volume to require fully automated solutions, while Advantest’s SSD Test Systems allow customers to grow their product portfolios while remaining adaptable to the changing needs of the SSD market. The newly introduced Advantest Cloud Solutions™ (ACS) is an ecosystem of cloud-based products and technologies based on a single scalable data platform that allows customers to accomplish intelligent data-driven workflows. Advantest supports globally distributed semiconductor supply chains from locations around the world.